Analysis and optimization of gate leakage current of power gating circuits
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, H.-O. | ko |
| dc.contributor.author | Shin, Youngsoo | ko |
| dc.date.accessioned | 2007-08-20T03:07:52Z | - |
| dc.date.available | 2007-08-20T03:07:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2006-01-24 | - |
| dc.identifier.citation | ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006, pp.565 - 569 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/1056 | - |
| dc.description.sponsorship | This work was supported by Samsung Electronics. | en |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Analysis and optimization of gate leakage current of power gating circuits | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000237227500110 | - |
| dc.identifier.scopusid | 2-s2.0-33748617571 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 565 | - |
| dc.citation.endingpage | 569 | - |
| dc.citation.publicationname | ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 | - |
| dc.identifier.conferencecountry | JA | - |
| dc.identifier.conferencelocation | Yokohama | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Shin, Youngsoo | - |
| dc.contributor.nonIdAuthor | Kim, H.-O. | - |
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