DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bhattacharya, S | ko |
dc.contributor.author | Darringer, J | ko |
dc.contributor.author | Ostapko, D | ko |
dc.contributor.author | Shin, Youngsoo | ko |
dc.date.accessioned | 2007-08-20T02:46:57Z | - |
dc.date.available | 2007-08-20T02:46:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-03 | - |
dc.identifier.citation | Sixth International Symposium on Quality Electronic Design, pp.482 - 487 | - |
dc.identifier.uri | http://hdl.handle.net/10203/1053 | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | A Mask Reuse Methodology for Reducing System-on-a-Chip Cost | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-84886645619 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 482 | - |
dc.citation.endingpage | 487 | - |
dc.citation.publicationname | Sixth International Symposium on Quality Electronic Design | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | New York | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Shin, Youngsoo | - |
dc.contributor.nonIdAuthor | Bhattacharya, S | - |
dc.contributor.nonIdAuthor | Darringer, J | - |
dc.contributor.nonIdAuthor | Ostapko, D | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.