CMOS Latch-Up 현상의 실험적 해석

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Publisher
대한전자공학회
Issue Date
1985
Language
KOR
Citation

대한전자공학회 CAD, 반도체, 재료 및 부품연구회 합동학술발표회, pp.85 - 87

URI
http://hdl.handle.net/10203/105160
Appears in Collection
EE-Conference Papers(학술회의논문)
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