Flow Regime Characterization and Void Fraction Measurement by Capacitance Transducers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chun, Moon Hyun | - |
| dc.contributor.author | Sung Chang-Kyung | - |
| dc.date.accessioned | 2013-03-14T04:01:46Z | - |
| dc.date.available | 2013-03-14T04:01:46Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | Winter Annual Meeting of the American Society of Mechanical Engineers., v., no., pp. - | - |
| dc.identifier.issn | 0402-1215 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/105052 | - |
| dc.language | ENG | - |
| dc.title | Flow Regime Characterization and Void Fraction Measurement by Capacitance Transducers | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0021598938 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Winter Annual Meeting of the American Society of Mechanical Engineers. | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Chun, Moon Hyun | - |
| dc.contributor.nonIdAuthor | Sung Chang-Kyung | - |
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