Effect of Frit and Sintering Conditions on the Microstructure and Electrical Properties in Thick Film Conductors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Ho Gi | - |
| dc.date.accessioned | 2013-03-14T03:32:59Z | - |
| dc.date.available | 2013-03-14T03:32:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1988 | - |
| dc.identifier.citation | 90th Annual Meethin oftheAm. Ceram. Soc., Inc. (U.S.A), v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/104845 | - |
| dc.language | ENG | - |
| dc.title | Effect of Frit and Sintering Conditions on the Microstructure and Electrical Properties in Thick Film Conductors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 90th Annual Meethin oftheAm. Ceram. Soc., Inc. (U.S.A) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Kim, Ho Gi | - |
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