Fast measurement of a pulsed plasma using a Fourier cutoff probe

Cited 1 time in webofscience Cited 0 time in scopus
  • Hit : 366
  • Download : 5
DC FieldValueLanguage
dc.contributor.authorNa, Byung-Keunko
dc.contributor.authorYou, Kwang-Hoko
dc.contributor.authorKim, D. -W.ko
dc.contributor.authorSeo, Byong-Hoonko
dc.contributor.authorChang, Hong-Youngko
dc.contributor.authorYou, S. -J.ko
dc.contributor.authorLee, Yun-Seongko
dc.date.accessioned2013-03-13T04:47:42Z-
dc.date.available2013-03-13T04:47:42Z-
dc.date.created2012-07-18-
dc.date.created2012-07-18-
dc.date.issued2012-04-
dc.identifier.citationJOURNAL OF INSTRUMENTATION, v.7-
dc.identifier.issn1748-0221-
dc.identifier.urihttp://hdl.handle.net/10203/104489-
dc.description.abstractA new method for time-resolved measurement of pulsed plasmas is suggested for reducing the measurement time. A short impulse has a broadband spectrum, and it can be used to make a spectrum in a short time. The use of a cutoff probe with a Fourier analysis (Fourier Cutoff Probe, FCP) provides the absolute electron densities with high speed. The measurement results from the FCP show good agreement with Langmuir probe's measurement results. However, it took only 1 minute 45 seconds using the FCP to make the temporal profile of electron densities in a pulsed plasma, versus 46 minutes for the Langmuir probe. The FCP's measurement was about 26 times faster than that by the Langmuir probe. This method will provide researchers a faster and convenient diagnostic method for pulsed plasmas.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectINDUCTIVELY-COUPLED PLASMA-
dc.subjectELECTRON-ENERGY DISTRIBUTION-
dc.subjectLASER THOMSON SCATTERING-
dc.subjectDENSITY-
dc.subjectDISCHARGES-
dc.subjectPOWER-
dc.subjectDIAGNOSTICS-
dc.titleFast measurement of a pulsed plasma using a Fourier cutoff probe-
dc.typeArticle-
dc.identifier.wosid000304012800022-
dc.identifier.scopusid2-s2.0-84860511616-
dc.type.rimsART-
dc.citation.volume7-
dc.citation.publicationnameJOURNAL OF INSTRUMENTATION-
dc.identifier.doi10.1088/1748-0221/7/04/C04022-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorChang, Hong-Young-
dc.contributor.nonIdAuthorYou, S. -J.-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorPlasma diagnostics - probes-
dc.subject.keywordAuthorData acquisition concepts-
dc.subject.keywordPlusINDUCTIVELY-COUPLED PLASMA-
dc.subject.keywordPlusELECTRON-ENERGY DISTRIBUTION-
dc.subject.keywordPlusLASER THOMSON SCATTERING-
dc.subject.keywordPlusDENSITY-
dc.subject.keywordPlusDISCHARGES-
dc.subject.keywordPlusPOWER-
dc.subject.keywordPlusDIAGNOSTICS-
Appears in Collection
PH-Journal Papers(저널논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 1 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0