Physical Observation of a Thermo-Morphic Transition in a Silicon Nanowire

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dc.contributor.authorChoi, Sung-Jinko
dc.contributor.authorMoon, Dong-Ilko
dc.contributor.authorDuarte, Juan P.ko
dc.contributor.authorAhn, Jae-Hyukko
dc.contributor.authorChoi, Yang-Kyuko
dc.date.accessioned2013-03-12T17:07:29Z-
dc.date.available2013-03-12T17:07:29Z-
dc.date.created2012-10-09-
dc.date.created2012-10-09-
dc.date.issued2012-03-
dc.identifier.citationACS NANO, v.6, no.3, pp.2378 - 2384-
dc.identifier.issn1936-0851-
dc.identifier.urihttp://hdl.handle.net/10203/102956-
dc.description.abstractA thermo-morphic transition of a silicon nanowire (Si-NW) is investigated in vacuum and air ambients, and notable differences are found under each ambient. In the vacuum ambient, permanent electrical breakdown occurs as a result of the Joule self-heating arising from the applied voltage across both ends of the Si-NW. The resulting current abruptly declines from a maximum value at the breakdown voltage (V-BD) to zero. In addition, the thermal conductivity of the Si-NW is extracted from the V-BD values under the vacuum ambient and shows good agreement with previously reported results. While the breakdown of the Si-NW does not exhibit negative differential resistance under the vacuum ambient, it interestingly shows negative differential resistance with multiple resistances in the current-voltage characteristics under the air ambient, similar to the behavior of carbon nanotubes. This behavior is triggered by current-induced oxidation, which leads to the thermo-morphic transition observed by TEM analyses. Additionally, the current-induced oxidation is favorably applied to reduce the size of a Si-NW at a localized and designated point.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectFIELD-EFFECT TRANSISTORS-
dc.subjectCARBON NANOTUBE-
dc.subjectROOM-TEMPERATURE-
dc.subjectELECTRICAL BREAKDOWN-
dc.subjectDEVICES-
dc.subjectPERFORMANCE-
dc.subjectCONDUCTIVITY-
dc.subjectCIRCUITS-
dc.subjectMEMORY-
dc.titlePhysical Observation of a Thermo-Morphic Transition in a Silicon Nanowire-
dc.typeArticle-
dc.identifier.wosid000301945900052-
dc.identifier.scopusid2-s2.0-84859137695-
dc.type.rimsART-
dc.citation.volume6-
dc.citation.issue3-
dc.citation.beginningpage2378-
dc.citation.endingpage2384-
dc.citation.publicationnameACS NANO-
dc.identifier.doi10.1021/nn2046295-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorthermo-morphic transition-
dc.subject.keywordAuthorthermo-morphism-
dc.subject.keywordAuthorsilicon nanowire-
dc.subject.keywordAuthorelectrical breakdown-
dc.subject.keywordAuthorair ambient-
dc.subject.keywordAuthorvacuum ambient-
dc.subject.keywordAuthorJoule heating-
dc.subject.keywordAuthorself-heating-
dc.subject.keywordAuthorcurrent-induced oxidation-
dc.subject.keywordAuthoroxidation-
dc.subject.keywordAuthorthermal conductivity-
dc.subject.keywordAuthormultiple resistance-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusCARBON NANOTUBE-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusELECTRICAL BREAKDOWN-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusCONDUCTIVITY-
dc.subject.keywordPlusCIRCUITS-
dc.subject.keywordPlusMEMORY-
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