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Highly scalable multi objective test suite minimisation using graphics cards Yoo, Shin; Harman, Mark; Ur, Shmuel, 3rd International Symposium on Search-Based Software Engineering, SSBSE 2011, pp.219 - 236, University of Szeged, 2011-09-12 |
Measuring and improving latency to avoid test suite wear out Yoo, Shin; Harman, Mark; Ur, Shmuel, IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110, Institute of Electrical and Electronics Engineers Inc., 2009-04-01 |
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