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The Impact of Concurrent Coverage Metrics on Testing Effectiveness Hong, Shin; Staats, Matthew; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2013-03-20 |
Understanding User Understanding: Determining Correctness of Generated Program Invariants Staats, Matthew; Hong, Shin; Kim, Moonzoo; Rothermel, Gregg, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
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