Showing results 1 to 1 of 1
Testing Intermediate Representations for Binary Analysis Kim, Soomin; Faerevaag, Markus; Jung, Minkyu; Jung, Seungil; Oh, DongYeop; Lee, JongHyup; Cha, Sang Kil, 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE), pp.353 - 364, IEEE Computer Society and ACM SIGSFOT, 2017-11-03 |
Discover