Showing results 1 to 24 of 24
A Hybrid Directed Test Suite Augmentation Technique Xu, Zhihong; Kim, Yunho; Kim, Moonzoo; Rothermel, Gregg, IEEE International Symposium on Software Reliability Engineering, IEEE, 2011-11-29 |
A Scalable Distributed Concolic Testing Approach: An Empirical Evaluation Kim, Moonzoo; Kim, Yunho; Rothermel, Gregg, IEEE International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2012-04-19 |
Ask the Mutants: Mutating faulty programs for fault localization Moon, Seokhyeon; Kim, Yunho; Kim, Moonzoo; Yoo, Shin, 7th IEEE International Conference on Software Testing, Verification and Validation, ICST 2014, pp.153 - 162, IEEE Computer Society, 2014-04-02 |
Automated Analysis of Industrial Embedded Software Kim, Moonzoo; Kim, Yunho, Automated Technology for Verification and Analysis, pp.51 - 59, Automated Technology for Verification and Analysis, 2011-10-14 |
Automated Unit Testing of Large Industrial Embedded Software Using Concolic Testing Kim, Yunho; Kim, Youil; Kim, Taeksu; Lee, Gunwoo; Jang, Yoonkyu; Kim, Moonzoo, 28th IEEE/ACM International Conference on Automated Software Engineering (ASE), pp.519 - 528, IEEE Computer Society and ACM SIGSFOT, 2013-11-14 |
CITRUS: Automated Unit Testing Tool for Real-world C plus plus Programs Herlim, Robert Sebastian; Kim, Yunho; Kim, Moonzoo, IEEE International Conference on Software Testing, Verification and Validation (ICST) Testing Tools track, pp.400 - 410, Institute of Electrical and Electronics Engineers Inc., 2022-04-05 |
Concolic Testing for High Test Coverage and Reduced Human Effort in Automotive Industry Kim, Yunho; Lee, Dongju; Baek, Junki; Kim, Moonzoo, International Conference on Software Engineering (ICSE), pp.151 - 160, IEEE Computer Society and ACM SIGSOFT, 2019-05-29 |
Concolic testing of the multi-sector read operation for flash memory file system Kim, Moonzoo; Kim, Yunho, 12th Brazilian Symposium on Formal Methods, SBMF 2009, pp.251 - 265, 2009-08-19 |
Concolic Testing on Embedded Software - Case Studies on Mobile Platform Programs Kim, Yunho; Kim, Moonzoo; Jang, Yoonkyu, ACM SIGSOFT Foundation of Software Engineering Industrial track, ACM SIGSOFT Foundation of Software Engineering Industrial track, 2011-09-05 |
Directed test suite augmentation: Techniques and tradeoffs Xu, Zhihong; Kim, Yunho; Kim, Moonzoo; Rothermel, Gregg; Cohen, Myra B., 18th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE-18, pp.257 - 266, ACM, 2010-11-07 |
Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark Herlim, Robert Sebastian; Hong, Shin; Kim, Yunho; Kim, Moonzoo, 13th International Symposium on Search-Based Software Engineering, SSBSE 2021, pp.121 - 135, Springer Science and Business Media Deutschland GmbH, 2021-10-11 |
Formal verification of a flash memory device driver - An experience report Kim, Moonzoo; Choi, Yunja; Kim, Yunho; Kim, Hotae, 15th International SPIN Workshop on Model Checking of Software, SPIN 2008, pp.144 - 159, SPIN, 2008-08-10 |
Hybrid Directed Test Suite Augmentation: An Interleaving Framework Kim, Yunho; Xu, Zhihong; Kim, Moonzoo; Cohen, Myra B.; Rothermel, Gregg, International Conference on Software Testing, Verification and Validation (ICST), IEEE Computer Society, 2014-04-02 |
Industrial Application of Concolic Testing Approach: A Case Study on libexif by Using CREST-BV and KLEE Kim, Yunho; Kim, Moonzoo; Kim, Youngjoo; Jang, Yoonkyu, International Conference on Software Engineering, IEEE/ACM, 2012-06-07 |
Industrial Application of Concolic Testing on Embedded Software: Case Studies Kim, Moonzoo; Kim, Yunho; Jang, Yoonkyu, IEEE International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2012-04-18 |
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage Kim, Yunho; Hong, Shin; Ko, Bongsuk; Phan Duy Loc; Kim, Moonzoo, IEEE Conference on Software Testing, Validation and Verification (ICST), pp.239 - 249, IEEE(Computer Society), 2018-04-11 |
MUSIC: Mutation Analysis Tool with High Configurability and Extensibility Phan Duy Loc; Kim, Yunho; Kim, Moonzoo, 11th IEEE International Conference on Software Testing, Verification and Validation (ICST), pp.40 - 46, IEEE(Computer Society), 2018-04-19 |
POWER: Program Option-Aware Fuzzer for High Bug Detection Ability Lee, Ahcheong; Ariq, Irfan; Kim, Yunho; Kim, Moonzoo, IEEE International Conference on Software Testing, Verification and Validation (ICST), pp.220 - 231, Institute of Electrical and Electronics Engineers Inc., 2022-04-06 |
Pre-testing Flash Device Driver through Model Checking Techniques Kim, Moonzoo; Kim, Yunho; Choi, Yunja; Kim, Hotae, IEEE International Conference on Software Testing, Verification and Validation, pp.475 - 484, IEEE, 2008-04-11 |
Precise Concolic Unit Testing of C Programs Using Extended Units and Symbolic Alarm Filtering Kim, Yunho; Choi, Yunja; Kim, Moonzoo, International Conference on Software Engineering (ICSE), pp.315 - 326, IEEE Computer Society and ACM SIGSOFT, 2018-05-30 |
Scalable distributed concolic testing: A case study on a flash storage platform Kim, Yunho; Kim, Moonzoo; Dang, Nam, 7th International Colloquium on Theoretical Aspects of Computing, ICTAC 2010, pp.199 - 213, ICTAC'10, 2010-09-01 |
SCORE: A scalable concolic testing tool for reliable embedded software Kim, Yunho; Kim, Moonzoo, ACM SIGSOFT Foundation of Software Engineering (FSE) Tool demonstration track, pp.420 - 423, ACM SIGSOFT Foundation of Software Engineering (FSE) Tool demonstration track, 2011-09-05 |
Target-driven compositional concolic testing with function summary refinement for effective bug detection Kim, Yunho; Hong, Shin; Kim, Moonzoo, 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2019, pp.16 - 26, Association for Computing Machinery, Inc, 2019-08-29 |
Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker Kim, Moonzoo; Kim, Yunho; Kim, Hotae, ASE 2008 - 23rd IEEE/ACM International Conference on Automated Software Engineering, pp.198 - 207, IEEE Computer Society and ACM SIGSFOT, 2008-09-15 |
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