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Optimizing for the number of tests generated in search based test data generation with an application to the oracle cost problem

Harman, Mark; Kim, Sung Gon; Lakhotia, Kiran; McMinn, Phil; Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.182 - 191, University of Nebraska Lincoln, 2010-04-06

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