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Showing results 1 to 5 of 5

1
A Bayesian Framework for Automated Debugging

Kang, Sungmin; Choi, Wonkeun; Yoo, Shin, 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023, pp.880 - 891, ACM, 2023-07-19

2
Language Models Can Prioritize Patches for Practical Program Patching

Kang, Sungmin; Yoo, Shin, 3rd IEEE/ACM International Workshop on Automated Program Repair, APR 2022, pp.8 - 15, Institute of Electrical and Electronics Engineers Inc., 2022-05-19

3
Large Language Models are Few-shot Testers: Exploring LLM-based General Bug Reproduction

Kang, Sungmin; Yoon, Juyeon; Yoo, Shin, 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE), IEEE, 2023-05-17

4
SINVAD: Search-based Image Space Navigation for DNN Image Classifier Test Input Generation

Kang, Sungmin; Feldt, Robert; Yoo, Shin, 42nd IEEE/ACM International Conference on Software Engineering Workshops, ICSEW 2020, Association for Computing Machinery, Inc, 2020-06-27

5
Towards Objective-Tailored Genetic Improvement Through Large Language Models

Kang, Sungmin; Yoo, Shin, 12th International Workshop on Genetic Improvement, University of Melbourne, 2023-05-20

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