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Showing results 1 to 13 of 13

1
Clustering test cases to achieve effective & scalable prioritisation incorporating expert knowledge

Yoo, Shin; Harman, Mark; Tonella, Paolo; Susi, Angelo, 18th International Symposium on Software Testing and Analysis, ISSTA 2009, pp.201 - 211, Association for Computing Machinery, Inc, 2009-07-22

2
Efficiency and early fault detection with lower and higher strength combinatorial interaction testing

Petke, Justyna; Yoo, Shin; Cohen, Myra B.; Harman, Mark, 2013 9th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering, ESEC/FSE 2013, pp.26 - 36, ACM Special Interest Group on Software Engineering (SIGSOFT), 2013-08-23

3
Empirical evaluation of pareto efficient multi-objective regression test case prioritisation

Epitropakis, Michael G; Yoo, Shin; Harman, Mark; Burke, Edmund K, International Symposium on Software Testing and Analysis, pp.234 - 245, ACM Special Interest Group on Software Engineering (SIGSOFT), 2015-07-16

4
Generalized Observational Slicing for Tree-Represented Modelling Languages

Gold, Nicolas E.; Binkley, David; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 11th Joint Meeting of European Software Engineering Conference (ESEC) / ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE), pp.547 - 558, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-09-08

5
Highly scalable multi objective test suite minimisation using graphics cards

Yoo, Shin; Harman, Mark; Ur, Shmuel, 3rd International Symposium on Search-Based Software Engineering, SSBSE 2011, pp.219 - 236, University of Szeged, 2011-09-12

6
Inferring automatic test oracles

Langdon, William B.; Yoo, Shin; Harman, Mark, 10th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2017, pp.5 - 6, Institute of Electrical and Electronics Engineers Inc., 2017-05

7
Measuring and improving latency to avoid test suite wear out

Yoo, Shin; Harman, Mark; Ur, Shmuel, IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110, Institute of Electrical and Electronics Engineers Inc., 2009-04-01

8
Optimizing for the number of tests generated in search based test data generation with an application to the oracle cost problem

Harman, Mark; Kim, Sung Gon; Lakhotia, Kiran; McMinn, Phil; Yoo, Shin, 3rd International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2010, pp.182 - 191, University of Nebraska Lincoln, 2010-04-06

9
ORBS and the limits of static slicing

Binkley, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, IEEE 15th International Working Conference on Source Code Analysis and Manipulation, SCAM 2015, pp.1 - 10, Institute of Electrical and Electronics Engineers Inc., 2015-09-27

10
ORBS: Language-independent program slicing

Binkle, David; Gold, Nicolas; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2014, pp.109 - 120, ACM Special Interest Group on Software Engineering (SIGSOFT), 2014-11-19

11
Pareto efficient multi-objective test case selection

Yoo, Shin; Harman, Mark, 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07 and PADTAD-V Workshop, pp.140 - 150, ACM Special Interest Group on Software Engineering (SIGSOFT), 2007-07-11

12
Provably optimal and human-competitive results in SBSE for spectrum based fault localisation

Xie, Xiaoyuan; Kuo, Fei-Ching; Chen, Tsong Yueh; Yoo, Shin; Harman, Mark, 5th International Symposium on Search-Based Software Engineering, SSBSE 2013, pp.224 - 238, University of St. Petersburg, 2013-08-25

13
Search based data sensitivity analysis applied to requirement engineering

Harman, Mark; Krinke, Jens; Ren, Jian; Yoo, Shin, 11th Annual Genetic and Evolutionary Computation Conference, GECCO-2009, pp.1681 - 1688, ACM SIGEVO, 2009-07-10

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