Browse "CS-Conference Papers(학술회의논문)" by Author Ur, Shmuel

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Measuring and improving latency to avoid test suite wear out

Yoo, Shin; Harman, Mark; Ur, Shmuel, IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110, Institute of Electrical and Electronics Engineers Inc., 2009-04-01

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