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Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage Kim, Yunho; Hong, Shin; Ko, Bongsuk; Phan Duy Loc; Kim, Moonzoo, IEEE Conference on Software Testing, Validation and Verification (ICST), pp.239 - 249, IEEE(Computer Society), 2018-04-11 |
Mutation-based Fault Localization for Real-world Multilingual Programs Hong, Shin; Lee, Byeongcheol; Kwak, Taehoon; Jeon, Yiru; Ko, Bongsuk; Kim, Yoonho; Kim, Moonzoo, International Conference on Automated Software Engineering, IEEE Computer Society and ACM SIGSFOT, 2015-11-12 |
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