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Showing results 44381 to 44400 of 101406

44381
Impact of customers' digital banking adoption on hidden defection: A combined analytical-empirical approach

Son, Yoonseock; Kwon, Hyeokkoo Eric; Tayi, Giri K.; Oh, Wonseok, JOURNAL OF OPERATIONS MANAGEMENT, v.66, no.4, pp.418 - 440, 2020-06

44382
Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs

Lek, CM; Cho, Byung Jin; Ang, CH; Tan, SS; Loh, WY; Zhen, JZ; Lap, C, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.17, no.6, pp.25 - 28, 2002-06

44383
Impact of device configuration on the temperature instability of Al-Zn-Sn-O thin film transistors

Jeong, Jae Kyeong; Yang, Shinhyuk; Cho, Doo-Hee; Park, Sang-Hee Ko; Hwang, Chi-Sun; Cho, Kyoung Ik, APPLIED PHYSICS LETTERS, v.95, no.12, 2009-09

44384
Impact of differential copayment on patient healthcare choice: evidence from South Korean National Cohort Study

Jo, Sangkyun; Jun, Duk Bin; Park, Sungho, BMJ OPEN, v.11, no.6, pp.e044549, 2021-06

44385
Impact of digital traces on the appreciation of movie contents

Lee, Moon Hwan; Cha, Seijin; Nam, Tek-Jin, DIGITAL CREATIVITY, v.26, no.3-4, pp.287 - 303, 2015-10

44386
Impact of discovery reference signals in LTE small-cell eNB on audio devices

Choi, Suna; Park, Soongi; Ahn, Seungyoung, ELECTRONICS LETTERS, v.52, no.10, pp.874 - 875, 2016-05

44387
Impact of dispersion, PMD, and PDL on the performance of spectrum-sliced incoherent light sources using gain-saturated semiconductor optical amplifiers

Kim, Hoon; Kim, S; Hwang, S; Oh, Y, JOURNAL OF LIGHTWAVE TECHNOLOGY, v.24, no.2, pp.775 - 785, 2006-02

44388
Impact of driving forces on molten pool in gas metal arc welding

Cho, Won-Ik; Na, Suck-Joo, WELDING IN THE WORLD, v.65, no.9, pp.1735 - 1747, 2021-09

44389
Impact of electrical band-limitation on transmission performance of CSRZ and CSRZ-DPSK modulation formats for high spectral efficiency DWDM systems

Lee, DS; Jing, Y; Ko, JS; Lee, Man Seop; Nirmalathas, A, IEICE TRANSACTIONS ON COMMUNICATIONS, v.E88B, no.5, pp.1977 - 1985, 2005-05

44390
Impact of Electrode Materials on Process Environmental Stability of Efficient Perovskite Solar Cells

Chung, Jaehoon; Shin, Seong Sik; Kim, Geunjin; Jeon, Nam Joong; Yang, Tae-Youl; Noh, Jun Hong; Seo, Jangwon, JOULE, v.3, no.8, pp.1977 - 1985, 2019-08

44391
Impact of embedded susceptor mass and exposure time on morphological and property alterations in SAC305 joints using microwave hybrid heating

Zhang, Shuai; Zhou, Hongzhi; Ding, Tianran; Long, Weimin; Zhong, Sujuan; Paik, Kyung-Wook; He, Peng; et al, MATERIALS LETTERS, v.357, 2024-02

44392
Impact of Emerging Hardware on Security and Privacy

Jaeger, Trent; Kang, Brent ByungHoon; Mentens, Nele; Sturton, Cynthia, IEEE SECURITY & PRIVACY, v.21, no.3, pp.6 - 7, 2023-05

44393
Impact of Energy Price Increases on the Economy

Ahn, Byong Hun, JOURNAL OF ENERGY RESEARCH, v.4, no.4, 1981-07

44394
Impact of environmental changes on the dynamics of temporal networks

Kim, Hyewon; Jo, Hang-Hyun; Jeong, Hawoong, PLOS ONE, v.16, no.4, 2021-04

44395
Impact of Environmental Disaster Movies on Corporate Environmental and Financial Performance

Kim, Henry Hyun-Do; Park, Kwangwoo, SUSTAINABILITY, v.13, no.2, pp.559, 2021-01

44396
Impact of Environmental Performance on Firm Value for Sustainable Investment: Evidence from Large US Firms

Yadav, Prayag Lal; Han, SeungHun; Rho, Jae Jeung, BUSINESS STRATEGY AND THE ENVIRONMENT, v.25, no.6, pp.402 - 420, 2016-09

44397
Impact of fast ions on density peaking in JET: fluid and gyrokinetic modeling

Eriksson, F.; Jeong, C.; Kwak, Sehyun, PLASMA PHYSICS AND CONTROLLED FUSION, v.61, no.7, 2019-07

44398
Impact of fast transient charging and ambient on mobility of WS2 field-effect transistor

Park, Junghak; Woo, Hyunsuk; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.35, no.5, 2017-09

44399
Impact of feed ionic concentration on colloidal and organic fouling of osmoticallydriven membrane process

Ruengruehan, Kaiwit; Fagkeaw, Pattarasiri; Jang, Duksoo; Ko, Seokoh; Kang, Seoktae, DESALINATION AND WATER TREATMENT, v.57, no.1, pp.24551 - 24556, 2016-11

44400
Impact of Fermi Level Pinning Due to Interface Traps Inside the Conduction Band on the Inversion-Layer Mobility in InxGa1-xAs Metal-Oxide-Semiconductor Field Effect Transistors

Taoka, Noriyuki; Yokoyama, Masafumi; Kim, Sang Hyeon; Suzuki, Rena; Lee, Sunghoon; Iida, Ryo; Hoshii, Takuya; et al, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.13, no.4, pp.456 - 462, 2013-12

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