Showing results 1 to 2 of 2
Chip Crack Imaging Detection Based on Line Laser Phase-Locked Thermal Imaging Ying, Xu; Wang Qingyuan; Luo Congcong; Sohn, Hoon, LASER & OPTOELECTRONICS PROGRESS, v.57, no.6, 2020-03 |
Detection of a Nanoscale Hot Spot by Hot Carriers in a Poly-Si TFT Using Polydiacetylene-Based Thermoresponsive Fluorometry Choi, Ji-Min; Choi, Sung-Jin; Yarimaga, Oktay; Yoon, Bora; Kim, Jong-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.5, pp.1570 - 1574, 2011-05 |
Discover