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A new method for image separation of overlapped images from a two-layered printed circuit board(PCB) Gweon, Dae-Gab; An, Jin Ung; Cho, Young Bin, IMAGE AND VISION COMPUTING, v.15, no.11, pp.861 - 866, 1997-11 |
Ambiguous Surface Defect Image Classification of AMOLED Displays in Smartphones Park, Yunwon; Kweon, In-So, IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.12, no.2, pp.597 - 607, 2016-04 |
Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics Kim, Seung-Woo; Lee, SY; Yoon, DS, OPTICAL ENGINEERING, v.36, no.12, pp.3309 - 3311, 1997-12 |
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