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A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization Jung, Yeon Sik, SOLID STATE COMMUNICATIONS, v.129, pp.491 - 495, 2004-02 |
Origin of Short Period Oscillation near GaAs Band-Gap Energy in Photoreflectance Kim, Jae Eun, SOLID STATE COMMUNICATIONS, v.102, no.4, pp.283 - 286, 1997-01 |
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