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First Lateral Contact Probing of 55-μm Fine Pitch Micro-Bumps

Kim, Chang-Keun; Yoon, Yong Hoon; Kwon, Donguk; Kim, Seunghwan; Yoon, Gun-Wook; Rhee, Min Woo; Yun, Jinyeong; et al, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.27, no.6, pp.1114 - 1123, 2018-12

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