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Showing results 1 to 5 of 5

1
Accelerated Life Tests for Products of Unequal Size

Bai, Do Sun; h.j. yun, IEEE TRANSACTIONS ON RELIABILITY, v.45, no.4, pp.611 - 618, 1996

2
An Optimal Design of Accelerated Life Test for Exponential Distribution

Bai, Do Sun; s.w. chung, RELIABILITY ENGINEERING & SYSTEM SAFETY, v.31, no.1, pp.57 - 64, 1991

3
Optimal design of accelerated degradation tests based on Wiener process models

Lim, Heonsang; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.38, no.2, pp.309 - 325, 2011

4
Optimal design of accelerated life tests with two stresses

Park, JW; Yum, Bong-Jin, NAVAL RESEARCH LOGISTICS, v.43, no.6, pp.863 - 884, 1996-09

5
Optimal Design of Partially Accleraated Life Tests for Lognormal Distribution under Type I Censoring

Bai, Do Sun; s. w. chung; y.r. chun, RELIABILITY ENGINEERING AND SYSTEM SAFETY, v.40, no.1, pp.85 - 92, 1993

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