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A study of morphological evolution of silicon microstructure based on phase field model Zhang, Linan; Zheng, Wei; Lee, Jungchul; Wu, Liqun; Kim, Dongchoul, FERROELECTRICS, v.520, no.1, pp.154 - 158, 2017 |
Applicability of step-coverage Modeling to TiO2 thin films in atomic layer deposition Kim, Ja-Yong; Kim, Jin-Hyock; Ahn, Ji-Hoon; Park, Pan-Kwi; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.12, pp.H1008 - H1013, 2007 |
Step coverage modeling of thin films in atomic layer deposition Kim, Ja-Yong; Ahn, Ji-Hoon; Kang, Sang-Won; Kim, Jin-Hyock, JOURNAL OF APPLIED PHYSICS, v.101, no.7, 2007-04 |
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