Browse by Subject Positive bias illumination stress (PBIS)

Showing results 1 to 2 of 2

1
A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors

Park, Jozeph; Nguyen Dinh Trung; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.135 - 140, 2016-06

2
The effect of ITO and Mo electrodes on the properties and stability of In-Ga-Zn-O thin film transistors

Park, Jozeph; Kim, Chang Sun; Kim, Yang Soo; Park, Yun Chang; Park, Hyung Jin; Bae, Byeong-Soo; Park, Jin-Seong; et al, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.129 - 134, 2016-06

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