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Showing results 1 to 5 of 5

1
Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002

2
Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04

3
Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.38, no.6, pp.479 - 487, 2003

4
Raman scattering studies on B+ implanted Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, VACUUM, v.68, no.2, pp.119 - 122, 2002-10

5
고순도 숙신산 생산을 위한 복합정제공정개발 = Development of complex purification process for the high purified Succinic acidlink

안재범; Ahn, Jae-Bum; et al, 한국과학기술원, 2006

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