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Atomic force microscope probe tips using heavily boron-doped silicon cantilevers realized in a (110) bulk silicon wafer Cho, Il-Joo; Park, Eun-Chul; Hong, Songcheol; Yoon, Euisik, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7103 - 7107, 2000-12 |
Development of a simulation program on the interaction between AFM tip and sample with respect to force = AFM tip-sample 간 힘을 고려한 상호작용 시뮬레이션 프로그램 개발link Kim, Ki-Won; 김기원; et al, 한국과학기술원, 2006 |
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