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Showing results 1 to 4 of 4

1
Effects of stress on solid-phase epitaxial regrowth and corner defect generation in As+-implanted, two-dimensional amorphized Si

Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JOURNAL OF CRYSTAL GROWTH, v.231, no.1-2, pp.107 - 114, 2001-09

2
Effects of stress on the microstructure of the corner defect in As+-implanted, two-dimensional amorphized Si

Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JOURNAL OF CRYSTAL GROWTH, v.233, no.4, pp.673 - 680, 2001-12

3
High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si

Choi, JH; Lee, JeongYong; Kim, YT, JOURNAL OF CRYSTAL GROWTH, v.223, no.1-2, pp.161 - 168, 2001-02

4
Microstructural characterization of InGaN/GaN multiple quantum wells with high indium composition

Cho, HK; Lee, JeongYong; Kim, CS; Yang, GM; Sharma, N; Humphreys, C, JOURNAL OF CRYSTAL GROWTH, v.231, no.4, pp.466 - 473, 2001-11

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