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A simple method for high-frequency characterization of (Ba,Sr)TiO3 thin film capacitors Jang, BT; Kwak, DH; Cha, SY; Lee, SH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.20, no.1-4, pp.215 - 224, 1998 |
Development of Dual Port Scanning Free Space Measurement System Hyun, Jongmin; Ahmed, Hassan; Lee, Jung-Ryul, MEASUREMENT SCIENCE & TECHNOLOGY, v.29, no.7, 2018-05 |
Investigation of the damage effect on electromagnetic performance evaluation of a radar absorbing structure Hyun, Jong-Min; Hong, Seung-Chan; Lee, Jung-Ryul, MATERIALS RESEARCH EXPRESS, v.6, no.11, 2019-11 |
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