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Effect of Electron-Beam Irradiation on Organic Semiconductor and Its Application for Transistor-Based Dosimeters Kim, Jae Joon; Ha, Jun Mok; Lee, Hyeok Moo; Raza, Hamid Saeed; Park, Ji Won; Cho, Sung-Oh, ACS APPLIED MATERIALS & INTERFACES, v.8, no.30, pp.19192 - 19196, 2016-08 |
Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions Chong, PF; Cho, Byung Jin; Chor, EF; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.4B, pp.2181 - 2185, 2000-04 |
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