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High-Electron-Mobility SiGe on Sapphire Substrate for Fast Chipsets Kim, Hyun Jung; Park, Yeonjoon; Bae, Hyung Bin; Choi, Sang H., ADVANCES IN CONDENSED MATTER PHYSICS, v.785415, 2015 |
Highly Biased Linear Condition Method for Separately Extracting Source and Drain Resistance in MOSFETs Kim, Gun-Hee; Bae, Hagyoul; Hur, Jae; Kim, Choong-Ki; Lee, Geon-Beom; Bang, Tewook; Son, Yoon-Ik; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.2, pp.419 - 423, 2018-02 |
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