Browse by Subject SILICON DIOXIDE
Showing results 1 to 11 of 11
| Comparison of the effective oxide thickness determined by ellipsometry with the result by medium energy ion scattering spectroscopy and high-resolution transmission electron microscopy Cho, HM; Lee, YW; Lee, IW; Moon, DW; Kim, BY; Kim, HJ; Kim, Byoung Yoon; et al, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.4, pp.1144 - 1149, 2001 |
| Efficient real-space multigrid method and applications to clusters and defects in SiO2 Jin, YG; Chang, Kee-Joo, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.40, no.3, pp.406 - 415, 2002-03 |
| Electron temperature control with a small mesh number grid in inductively coupled plasmas Bai, KH; Choi, CK; Chang, Hong-Young, PLASMA SOURCES SCIENCE & TECHNOLOGY, v.13, pp.662 - 667, 2004-11 |
| Electron temperature control with grid bias in inductively coupled argon plasma Hong, JI; Seo, SH; Kim, SS; Yoon, NS; Chang, Choong-Seock; Chang, Hong-Young, PHYSICS OF PLASMAS, v.6, no.3, pp.1017 - 1028, 1999-03 |
| Highly selective SiO2 etching in low-electron-temperature inductively coupled plasma Bai, KH; Chang, Hong-Young; Kwon, GC; Kim, HS; Kim, JS, JAPANESE JOURNAL OF APPLIED PHYSICS, v.46, pp.3602 - 3604, 2007-06 |
| Low temperature SiOx thin film deposited by plasma enhanced atomic layer deposition for thin film encapsulation applications Lee, Young-Soo; Han, Ju-Hwan; Park, Jin-Seong; Park, Jozeph, Journal of Vacuum Science and Technology A, v.35, no.4, 2017-07 |
| Optimization and performance analysis of a multilayer structure for daytime radiative cooling Kim, Mingeon; Seo, Junyong; Yoon, Siwon; Lee, Heon; Lee, Jungchul; Lee, Bong Jae, JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, v.260, 2021-02 |
| Origin of temperature-sensitive hole current at low gate voltage regime in ultrathin gate oxide Ang, CH; Ling, CH; Cheng, ZY; Cho, Byung Jin, JOURNAL OF APPLIED PHYSICS, v.88, no.5, pp.2872 - 2876, 2000-09 |
| Role of hole fluence in gate oxide breakdown Li, MF; He, YD; Ma, SG; Cho, Byung Jin; Lo, KF; Xu, MZ, IEEE ELECTRON DEVICE LETTERS, v.20, no.11, pp.586 - 588, 1999-11 |
| Solution-Processed, Photo-Patternable Fluorinated Sol-Gel Hybrid Materials as a Bio-Fluidic Barrier for Flexible Electronic Systems Lee, Injun; Kim, Yong Ho; Jang, Jinhyeong; Lee, Kwang-Heum; Jang, Junho; Lim, Young-Woo; Park, Sang-Hee Ko; et al, ADVANCED ELECTRONIC MATERIALS, v.6, no.3, pp.1901065, 2020-03 |
| THE EFFECTS OF X-RAY IRRADIATION-INDUCED DAMAGE ON RELIABILITY IN MOS STRUCTURES KIM, S; LEE, H; HAN, CH; Lee, Kwyro; CHOI, S; JEON, Y; DIFABRIZIO, E; et al, SOLID-STATE ELECTRONICS, v.38, no.1, pp.95 - 99, 1995-01 |
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