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Showing results 1 to 5 of 5

1
An Optimal Design of Accelerated Life Test for Exponential Distribution

Bai, Do Sun; s.w. chung, RELIABILITY ENGINEERING & SYSTEM SAFETY, v.31, no.1, pp.57 - 64, 1991

2
Optimal design of accelerated life tests under modified stress loading methods

Park, SJ; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.25, no.1, pp.41 - 62, 1998-02

3
Optimal design of accelerated life tests with two stresses

Park, JW; Yum, Bong-Jin, NAVAL RESEARCH LOGISTICS, v.43, no.6, pp.863 - 884, 1996-09

4
Optimal Design of Partially Accleraated Life Tests for Lognormal Distribution under Type I Censoring

Bai, Do Sun; s. w. chung; y.r. chun, RELIABILITY ENGINEERING AND SYSTEM SAFETY, v.40, no.1, pp.85 - 92, 1993

5
Optimum Simple Ramp-Tests for the Weibull Distribution and Type I Censoring

Bai, Do Sun; m.s. cha; s.w. chung, IEEE TRANSACTIONS ON RELIABILITY, v.41, no.3, pp.407 - 413, 1992

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