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Development of scanning single port free space measurement setup for imaging reflection loss of microwave absorbing materials Ahmed, Hassan; Hyun, Jongmin; Lee, Jung-Ryul, MEASUREMENT, v.125, pp.114 - 122, 2018-09 |
Periodic frequency selective surface coupled highly efficient, broadband, single layer microwave absorber Panwar, Ravi; Singh, Dharmendra; Lee, Jung Ryul, OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, v.12, no.7-8, pp.426 - 430, 2018-07 |
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