Showing results 1 to 3 of 3
Frequency-dependent electrical and thermal response of heated atomic force microscope cantilevers Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P., JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.16, no.2, pp.213 - 222, 2007-04 |
Measurement uncertainties in resonant characteristics of MEMS resonators Lee, Il; Lee, Jungchul, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.27, no.2, pp.491 - 500, 2013-02 |
Topography imaging with a heated atomic force microscope cantilever in tapping mode Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P., REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.4, 2007-04 |
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