Showing results 1 to 3 of 3
ANNEALING KINETICS IN AMORPHOUS-SILICON FIELD-EFFECT TRANSISTORS B.S. Bae; Choochon Lee, PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, v.65, no.5, pp.933 - 944, 1992 |
EVALUATION METHOD FOR STABILITY OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS Hwang, CS; Bae, BS; Kong, HS; Lee, Choochon, APPLIED PHYSICS B-LASERS AND OPTICS, v.78, no.5, pp.3467 - 3471, 1995-09 |
The isochronal annealing study on the bias stressed amorphous silicon thin film transistors Hwang, CS; Bae, BS; Lee, Choochon, JOURNAL OF NON-CRYSTALLINE SOLIDS, v.200, pp.499 - 502, 1996-05 |
Discover