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Low-frequency noise (LFN) and reliability in nanowire FETs and junctionless-accumulation-mode (JAM) FinFETs = 나노와이어 소자와 무접합 축적 방식 핀펫 소자에 관한 저주파 노이즈 및 신뢰성 연구link

Yoon, Young Gwang; 윤영광; et al, 한국과학기술원, 2015

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