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Bias-Dependent Effective Channel Length for Extraction of Subgap DOS by Capacitance-Voltage Characteristics in Amorphous Semiconductor TFTs Choi, Hyunjun; Lee, Jungmin; Bae, Hagyoul; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.62, no.8, pp.2689 - 2694, 2015-08 |
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