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Detection and clustering of mixed-type defect patterns in wafer bin maps Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01 |
Detection and clustering of mixed-type defect patterns in Wafer Bin maps = 웨이퍼 빈 맵의 혼합된 형태의 결함 패턴 탐지 및 분류link Kim, Jinho; 김진호; et al, 한국과학기술원, 2016 |
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