Showing results 1 to 3 of 3
Effects of Bottom Polysilicon Doping on the Reliability of Interpoly Oxide Grown by Using Electron Cyclotron Resonance N2O-Plasma N-I Lee; J-W Lee; S-H Hur; H-S Kim; C-H Han, JAPANESE JOURNAL OF APPLIED PHYSICS, v.37, no.3B, pp.1125 - 1128, 1998-01 |
Endurance characteristics and degradation mechanism of polysilicon thin film transistor EEPROMs with electron cyclotron resonance NaO-plasma gate oxide Lee, NI; Lee, JW; Han, Chul-Hi, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.38, no.4B, pp.2215 - 2218, 1999-04 |
Nonvolatile Memories Based on Graphene and Related 2D Materials Bertolazzi, Simone; Bondavalli, Paolo; Roche, Stephan; San, Tamer; Choi, Sung-Yool; Colombo, Luigi; Bonaccorso, Francesco; et al, ADVANCED MATERIALS, v.31, no.10, pp.1806663, 2019-03 |
Discover