Showing results 1 to 2 of 2
Characterization of Atomic-Layer-Deposited (ALD) Al2O3-Passivated Sub-50-mu m-thick Kerf-less Si Wafers by Controlled Spalling Lee, Yong Hwan; Cha, Hamchorom; Choi, Sunho; Chang, Hyo Sik; Jang, Boyun; Oh, Jihun, ELECTRONIC MATERIALS LETTERS, v.14, no.3, pp.363 - 369, 2018-05 |
Silicon solar thin film spalling using epoxy resin with varying Young’s modulus = 에폭시의 탄성계수 변화에 따른 태양전지용 실리콘 박막 스폴링link Han, Minsung; Han, Seung Min; et al, 한국과학기술원, 2017 |
Discover