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Showing results 32 to 35 of 35

32
The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors

Kim, Taeho; Hur, Jihyun; Jeon, Sanghun, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.31, no.5, 2016-05

33
Thermal stability of (HfO2)(x)(Al2O3)(1-x) on Si

Yu, HY; Wu, N; Li, MF; Zhu, CX; Cho, Byung Jin; Kwong, DL; Tung, CH; et al, APPLIED PHYSICS LETTERS, v.81, no.19, pp.3618 - 3620, 2002-11

34
Thin Ion-Gel Dielectric Layer to Enhance the Stability of Polymer Transistors

Lee, Sung Won; Shin, Minkwan; Park, Jae Yoon; Kim, Bong Soo; Tu, Deyu; Jeon, Sanghun; Jeong, Unyong, SCIENCE OF ADVANCED MATERIALS, v.7, no.5, pp.874 - 880, 2015-05

35
Ultrathin ZrOx-Organic Hybrid Dielectric (EOT 3.2 nm) via Initiated Chemical Vapor Deposition for High-Performance Flexible Electronics

Kim, Min Ju; Pak, Kwanyong; Choi, Junhwan; Lee, Tae In; Hwang, Wan Sik; Im, Sung Gap; Cho, Byung-Jin, ACS APPLIED MATERIALS & INTERFACES, v.11, no.47, pp.44513 - 44520, 2019-11

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