Showing results 1 to 1 of 1
Validity of film-thickness estimates based on angle-resolved X-ray photoelectron spectroscopy using various inelastic mean-free-path formulae Lee, H.; Kim, Sehun; Lee, D.; Hwang, C., JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, no.6, pp.1915 - 1920, 2007 |
Discover