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The characterization of Cr secondary oxide phases in ZnO films studied by X-ray spectroscopy and photoemission spectroscopy Chiou J.W.; Chang S.Y.; Huang W.H.; Chen Y.T.; Hsu C.W.; Hu Y.M.; Chen J.M.; et al, APPLIED SURFACE SCIENCE, v.257, no.11, pp.4863 - 4866, 2011-03 |
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