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The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.100, no.17, 2012-04 |
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