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Effects of dielectric materials on electromigration failure Doan, J.C.; Lee, S.; Lee, Seok-Hee; Flinn, P.A.; Bravman, J.C.; Marieb, T.N., JOURNAL OF APPLIED PHYSICS, v.89, no.12, pp.7797 - 7808, 2001-06 |
Prediction of forming limit for sheet metals between equi-biaxial tension and uniaxial tension using a new ductile fracture criterion Zheng, Lihuang; Wang, Zhongjin; Wan, Min; Meng, Bao, ARCHIVES OF CIVIL AND MECHANICAL ENGINEERING, v.23, no.4, 2023-09 |
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