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Effects of operational and geometrical conditions upon photosensitivity of amorphous InZnO thin film transistors Park, Sungho; Park, Sekyoung; Ahn, Seung-Eon; Song, Ihun; Chae, Wonseok; Han, Manso; Lee, Jeseung; et al, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.31, no.5, 2013-09 |
Photosensitivity of InZnO thin-film transistors using a solution process Choi, Jongwon; Park, Junghak; Lim, Keon-Hee; Cho, Nam-kwang; Lee, Jinwon; Jeon, Sanghun; Kim, Youn Sang, APPLIED PHYSICS LETTERS, v.109, no.13, 2016-09 |
The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.100, no.17, 2012-04 |
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