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Showing results 172421 to 172440 of 276296
| Scanline Resolution-invariant Depth Completion using a Single Image and Sparse LiDAR Point Cloud Ryu, Kwonyoung; Lee, Kang-il; Cho, Jegyeong; Yoon, Kuk-Jin, IEEE ROBOTICS AND AUTOMATION LETTERS, v.6, no.4, pp.6961 - 6968, 2021-10 |
| Scannable Dual-Focus Metalens with Hybrid Phase Go, Gi-Hyun; Park, Chung Hyun; Woo, Kie Young; Choi, Minho; Cho, Yong-Hoon, NANO LETTERS, v.23, no.8, pp.3152 - 3158, 2023-04 |
| Scanner for two-dimensional optical scanning, manufacturing method thereof, and medical imaging apparatus using the same 정기훈; 서영현; 박현철; 황경민, 2017-12-05 |
| Scanner identification using spectral noise in the frequency domain Choi, Chang-Hee; Lee, Min-Jeong; Lee, Heung-Kyu, 2010 17th IEEE International Conference on Image Processing, ICIP 2010, pp.2121 - 2124, IEEE, 2010-09-26 |
| Scanning a boiler room using a low price scanner = 저가형 스캐너를 이용한 보일러룸의 스캔link Liu, Shengyu; Han, Soonhung; et al, 한국과학기술원, 2017 |
| Scanning AC nanocalorimetry study of Zr/B reactive multilayers Lee, Dongwoo; Sim, Gi-Dong; Xiao, Kechao; Choi, Yong Seok; Vlassak, Joost J., JOURNAL OF APPLIED PHYSICS, v.114, no.21, 2013-12 |
| SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES BARD, AJ; FAN, FRF; Kwak, Juhyoun; LEV, O, ANALYTICAL CHEMISTRY, v.61, no.2, pp.132 - 138, 1989-01 |
| SCANNING ELECTROCHEMICAL MICROSCOPY - THEORY OF THE FEEDBACK MODE Kwak, Juhyoun; BARD, AJ, ANALYTICAL CHEMISTRY, v.61, no.11, pp.1221 - 1227, 1989-06 |
| SCANNING ELECTROCHEMICAL MICROSCOPY .5. A STUDY OF THE CONDUCTIVITY OF A POLYPYRROLE FILM Kwak, Juhyoun; LEE, C; BARD, AJ, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.137, no.5, pp.1481 - 1484, 1990-05 |
| Scanning Electrochemical Microscopy. Apparatus and Two-Dimensional Scans of Conductive and Insulating Substrates Kwak, Juhyoun, ANALYTICAL CHEMISTRY, v.61, no.17, pp.1794 - 1799, 1989-09 |
| Scanning electron and field emission microscopy of supported metal clusters Castro, T; Li, YZ; Reifenberger, R; Choi, E; Park, SeungBin; Andres, RP, ACS Symposium Series 437, pp.329 - 341, ACS Symposium, 1990 |
| Scanning flow-impedance microscopy: a non-contact type imaging technique based on hydrodynamics = 유체역학 현상을 이용한 비접촉식 3차원 형상 측정 현미경link Kim, Tae-Young; 김태영; et al, 한국과학기술원, 2010 |
| Scanning flow-impedance microscopy: A simple imaging technique based on hydrodynamics Kim, Tae Young; Kim, DK; Kim, SungJin; Kim, DK, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.10, 2009-10 |
| Scanning Hall probe measurements of field distributions of a coated conductor under applied fields Yoo, J; Jung, YW; Lee, J; Lim, S; Lee, S; Jung, YH; Youm, Do-Jun; et al, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.19, pp.1291 - 1296, 2006-12 |
| Scanning MEMS Grating for Micro-spectrometer application Jeon, Jaehoon; Jeong, Ki-Hun; Ahn, Myeong-Su; Park, Jung Woo; Kim, Gi Beom, SPIE ABC 2021(Annual Biophotonics Conference 2021), Optical Society of Korea, SPIE, 2021-11-05 |
Scanning MEMS Mirror for High Definition and High Frame Rate Lissajous Patterns Seo, Yeong-Hyeon; Hwang, Kyungmin; Kim, Hyunwoo; Jeong, Ki-Hun, MICROMACHINES, v.10, no.1, 2019-01 |
| Scanning Parameter Optimization for Inspectation of Wedling Defects in X-ray Linear Laminography Park, Miran; Lee, Minju; Kim, Giyoon; Hwang, Sun-Uk; Kim, Hyean Dock; Cho, Seungryong; Cho, Gyuseong, International confernece on Thermoelectrics (ICT), International confernece on Thermoelectrics (ICT), 2017-08-01 |
| Scanning Parameter Optimization for Inspection of Wedling Defects in X-ray Linear Laminography Park, Miran; Lee, Minju; Kim, Kiyoon; Hwang, Sun-Uk; Jin, Sang Young; Kim, Hyunduk; Cho, Seungryong; et al, iCT2017 - 7th International Conference on Industrial Computed Tomography, iCT, 2017-02-08 |
| Scanning Photoemission Microscopy of Graphene Sheets on SiO2 Kim, Ki-Jeong; Lee, Hangil; Choi, Jae-Hyun; Youn, Young-Sang; Choi, Jung-Hun; Lee, Han-Koo; Kang, Tai-Hee; et al, ADVANCED MATERIALS, v.20, no.19, pp.3589 - 3589, 2008-10 |
| Scanning probe microscope lithography를 이용한 $PbTiO_3$ 강유전체 cell의 2차원 배열 = 2-D array of ferroelectric $PbTiO_3$ cell by scanning probe microscope lithographylink 김령희; Kim, Ryoung-Hee; et al, 한국과학기술원, 2006 |
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