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Showing results 124801 to 124820 of 276341
| Measurement of Barkhausen Noise by Two Types of Probes in 3\% Silicon Steal. D.G. Hwang; Ho Chul Kim, 새물리, v.5, 1992 |
| Measurement of bending-induced birefringence in a hollow-core photonic crystal fiber Chung, Dongyun; Park, Hee Su; Rotermund, Fabian; Kim, Byoung Yoon, OPTICS LETTERS, v.44, no.23, pp.5872 - 5875, 2019-12 |
| Measurement of bimodal size distribution of nanoparticles by using the spatial distribution of laser-induced plasma Jung, EC; Yun, Jong-Il; Kim, JI; Bouby, M; Geckeis, H; Park, YJ; Park, KK; et al, APPLIED PHYSICS B-LASERS AND OPTICS, v.87, no.3, pp.497 - 502, 2007-05 |
| Measurement of Blood Pressure via a Skin-Mounted, Non-Invasive Pressure Sensor Li, Shupeng; Park, Yoonseok; Luan, Haiwen; Wang, Heling; Kwon, Kyeongha; Rogers, John A.; Huang, Yonggang, JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, v.88, no.10, 2022-07 |
| Measurement of boiling heat transfer coefficients for non-flammable cryogenic mixed refrigerant in various compositions Yoo, Junghyun; Jin, Lingxue; Lee, Cheonkyu; Jeong, Sangkwon, 2016 한국 초전도 저온공학회 동계학술대회, 한국초전도저온공학회, 2016-01-22 |
| Measurement of Brain Activity using NIRS Ye, Jong Chul; Jung, JW; Jeong, Y, 제19회 신호처리합동학술대회, 2006-09 |
| Measurement of carrier generation lifetime in SOI devices Shin, Hyung-Cheol; Racanelli, M; Huang, WM; Foerstner, J; Hwang, T; Schroder, DK, SOLID-STATE ELECTRONICS, v.43, no.2, pp.349 - 353, 1999-02 |
| Measurement of carrier-envelope phase changes of 1kHz amplified laser pulses by spectral interferometry Nam, Chang Hee; Imran, Tayyab; Lee, Yong Soo; Sung, Jae Hee; Yu, Tae Jun, Asian Workshop on Generation and Applications of High-order Harmonics, pp.34 -, 2005 |
| Measurement of cavity loss and threshold gain in a vertical-cavity surface-emitting laser using an external mirror Ha, KH; Lee, Yong-Hee, 17th International Comission for Optics, pp.628 - 0, 1996-06-01 |
| Measurement of change in properties of PCB for the irradiation of Co-60 gamma-ray for space application of CCGA484 daisy chain FPGA device' Shin, Goo-Hwan; Seo, Jeong-Ki; Park, Hong-Yong; Ryu, Kwang-Sun; Lee, In; Song, Jin-Hwan, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.63, no.7, pp.1451 - 1454, 2013-10 |
| Measurement of changes in cerebrospinal fluid pulsation after traumatic brain injury using EPI-based functional MRI Kim, Jun-Hee; Park, Sung-Hong, 2023 ISMRM & ISMRT Annual Meeting & Exhibition, pp.3015, International Society for Magnetic Resonance in Medicine, 2023-06-06 |
| Measurement of Changes in Stress during Mutual Conversion Process of Ni(OH)2/NiOOH System Pyun, Su Il, Proc. of the 47th Japan Conference on Materials and Environments, pp.91 - 94, 2000 |
| Measurement of CO2-water interfacial tension under pressure and temperature conditions of reservoirs Park, Taehyung; Ahn, Joon Beom; Kwon, Tae Hyuk, KGS Spring National Conference 2016, 한국지반공학회, 2016-03-18 |
| Measurement of concentration of bio-material by using acoustic resonator Chen, Yugang; Park, Yong-Hwa, The 6th Korea-Japan Symposium on Dynamics & Control, Korean Society of Mechanical Engineers, 2019-05-31 |
| Measurement of Creep and Relaxation Behaviors of CSP using Moire Interferometry Ham, SJ; Lee, Soon-Bok; Kim, DH, Experimental/Numerical Mechanics in Electronic Packaging, pp.738 - 739, Experimental/Numerical Mechanics in Electronic Packaging, 2000-06 |
| Measurement of creep and relaxation behaviors of wafer-level CSP assembly using Moire interferometry Ham, SJ; Lee, Soon-Bok, JOURNAL OF ELECTRONIC PACKAGING, v.125, pp.282 - 288, 2003-06 |
| Measurement of critical heat flux for narrow annuli submerged in saturated water Kim, SH; Baek, WP; Chang, Soon-Heung, NUCLEAR ENGINEERING AND DESIGN, v.199, no.1-2, pp.41 - 48, 2000-06 |
| Measurement of critical heat flux for SiC-coated stainless steel plate and α-SiC tube with short-heated length under atmospheric condition Kam, Dong Hoon; Lee, Jong Hyuk; Lee, Taeseung; Jeong, Yong Hoon, 2014 International Congress on Advances in Nuclear Power Plants, American Nuclear Society, 2014-04-09 |
| Measurement of critical temporal inconsistency for quality assessment of synthesized video Kim, Hak Gu; Ro, Yong Man, IEEE international conference on image processing (ICIP), IEEE, 2016-09-25 |
| Measurement of Critical Thickness of Si1-xGex Heterostructures Grown by Silicon Molecular Beam Epitaxy : Comparison with Theoretical Models 강상원, 한국물리학회, 92추계물리학회, 1992 |
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