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Showing results 124981 to 125000 of 276409
| Measurement of Neutron Emission Rate of Cf-252 Source by the Comparative Method sun-tae hwang; Lee, Kun Jai, JAPANESE JOURNAL OF APPLIED PHYSICS, v.13, no.3, pp.138 - 144, 1987 |
| Measurement of Neutron Fluence and Dose Spectra Using an Extended Bonner Sphere and a Tissue Equivalent Proportional Counter Cho, Gyuseong; Kim, BH; Chang, SY; Lee, HS, Symposium on Neutron Dosimetry, 2003 |
| Measurement of Neutron Spectra at the Inside and outside of the Target Room of 65 MeV Electron LINAC using an Extended Bonner Spher Kim, B. H; Chang, S. Y; Kim, J. S; Lee, H. S; Kwak, S. W; Cho, Gyuseong, JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.41, no.0, pp.176 - 179, 2004-03 |
| Measurement of Neutron Spectra at the Inside and outside of the Target Room of 65 MeV Electron LINAC using an Extended Bonner Sphere Cho, Gyuseong; Kim, BH; Chang, SY; Kim, JS; Lee, HS; Kwak, SW, ISORD-2, 2003 |
| Measurement of neutron spectra using an extended bonner multisphere spectrometry system = 광역 보너 다중구 분광시스템을 이용한 중성자 스펙트럼 측정에 관한 연구link Kim, Bong-Hwan; 김봉환; et al, 한국과학기술원, 2004 |
| Measurement of Nonlinear Time-variant Source Characteristics of Intake and Exhaust Systems in Fluid Machines 장승호; 이정권, 한국음향학회지, v.24, no.3, pp.87 - 89, 2005-09 |
| Measurement of optical coefficients of tissue-like solutions using a combination method of infinite and semi-infinite geometries with continuous near infrared light Ko, W; Kwak, Yoon Keun; Kim, Soohyun, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.9A , pp.7158 - 7162, 2006-09 |
| Measurement of optical constants for polymerized cholesteric liquid crystal films by using transmittance and reflectance spectra Yoon, Ki Cheol; Pak, Hunkyun; Kim, Sung Tae; Jung, Jae Chul; Park, Hyun Duk; Park, OOk; Park, Jong Rak, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.49, no.1, pp.359 - 364, 2006-07 |
| Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05 |
| Measurement of P- and S-wave Velocity of Cylinderical bars using Piezoceramics Choi, Shin-Gyu; Kwon, Tae-Hyuk, The Twenty-Seventh KKHTCNN Symposium on Civil Engineering, KKHTCNN, 2014-11-10 |
| Measurement of partially specular objects by controlling imaging range Jeong J.; Hong D.; Cho, Hyungsuck, Optomechatronic Computer-Vision Systems II, 2007-10-08 |
| Measurement of particle density in a dusty plasma by a single-pass laser extinction method Seon, CR; Park, HY; Choe, Wonho, , 2005-06 |
| MEASUREMENT OF PARTICLE DEPOSITION VELOCITY TOWARD A HORIZONTAL SEMICONDUCTOR WAFER BY USING A WAFER SURFACE SCANNER BAE, GN; LEE, CS; Park, Seung O, AEROSOL SCIENCE AND TECHNOLOGY, v.21, no.1, pp.72 - 82, 1994-07 |
| Measurement of parts deformation and misalignment by using a visual sensing system Kim J.Y.; Cho, Hyungsuck; Kim S., Proceedings of the 1997 IEEE International Symposium on Computational Intelligence in Robotics and Automation, CIRA, pp.362 - 367, IEEE, 1997-07-10 |
| Measurement of Perceived Urgency of Synthesized Voice Warning 박경수, Proc. HCI '97 Symp., Kor. Info. Sci. Soc., pp.423 - 426, 1997 |
| Measurement of performance and observation of liquid flow in a transparent direct methanol fuel cell 홍원희; 임현숙, 2008년 춘계 한국화학공학회, 한국화학공학회, 2008-10 |
| Measurement of perpendicular spin torque at high bias via the pulsed switching phase diagram Park, Seung-Young; Jo, Younghun; Lee, Kyung-Jin, PHYSICAL REVIEW B, v.84, no.21, 2011-12 |
| Measurement of phase distributions on the surface in subcooled pool boiling of FC-72 Jung, J.; Kim, J.; Lee, Hyosang; Kim, Sung-Jin, INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, v.115, pp.62 - 72, 2017-12 |
| Measurement of Picosecond Pulse Propagation Characteristics on Coplanar Transmission Lines Kim, Joungho; Lee, Jongjoo; Yu, S., 5th IEEE Workshop on Signal Propagation on Interconnects, IEEE, 2001 |
| Measurement of point-spread function (PSF) for confocal fluorescence microscopy Song I.; Yoo H.; Choo J.; Gweon, Dae-Gab, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, v.5878, pp.1 - 9, 2005-08-02 |
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