Showing results 1 to 2 of 2
Integration Challenges of Nanoporous Low Dielectric Constant Materials Kim, Taek-Soo; Dauskardt, Reinhold H., IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.9, no.4, pp.509 - 515, 2009-12 |
Molecular Mobility under Nanometer Scale Confinement Kim, Taek-Soo; Dauskardt, Reinhold H., NANO LETTERS, v.10, no.5, pp.1955 - 1959, 2010-05 |
Discover